Back Scattered Electron Test Specimens

Back Scattered Electron Test SpecimensBSE Atomic Reference Specimen Electron micrograph of the nickel copper backscattered electron reference specimen. BSE image at low magnification. The contrast difference between the two wires is visible due to the atomic number difference between the nickel copper. An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z)

Average capacity: 160 blocks and 1

Technical Data:   Value Range Resonant Freq

The individual box numbers are never repeated

to check that column conditions and detector alignment are satisfactory

The oxide-sharpened wedge tip has two peaks per tip

5ml Snap Cap Macrocentrifuge Tubes

1T-ISO and -0

polyethylene (HDPE)

Material  Part number Copper 3HGC75/300 Nickel 3HGN75/300 Pattern Pitch microns Mesh Hole microns Bar microns Transmission % Tolerance +/-microns  3HG_75/300 340x85 75x300 288x55 30 62 5

Central square of 2 x 2mm Test Grating for Lateral Calibration

HeldSecure™ offers a double internal corrugated construction supporting up to 250 lbs

#16340 Double Slotted Mini Vise